粉末压片—波长色散X 射线荧光光谱法在钼矿石测定中的应用

J4 ›› 2011, Vol. 19 ›› Issue (2): 78-80.

粉末压片—波长色散X 射线荧光光谱法在钼矿石测定中的应用

罗学辉，王春生，陈占生，张勇

武警黄金地质研究所，河北廊坊065000

收稿日期:2010-10-22 修回日期:2011-02-25 出版日期:2011-04-28 发布日期:2012-05-11
作者简介:罗学辉（1979-），男，内蒙古乌兰察布人，工程师，主要从事X 荧光光谱分析及矿物分析工作.ls19760811@sohu.com

Determination of Molybdenum Ores by Powder Press Slice-Wavelength Dispersive X-Rafluorescence Spectrometry

LUO Xuehui,WANG Chunsheng,CHEN Zhansheng,ZHANG Yong

Gold Geological Institute of CAPF，Langfang 065000,Hebei,China

Received:2010-10-22 Revised:2011-02-25 Online:2011-04-28 Published:2012-05-11

摘要/Abstract

摘要：

试样用高密度聚乙烯干粉镶边衬底压片，波长色散X 射线荧光光谱法测定钼矿石中Mo 及其伴生元素W、Sn、Cu、Pb、Zn、Bi的含量。根据我国钼矿品位的特点，选择国家标样与某一大型钼矿样品相结合的办法建立校准曲线，钼测量范围为0.03%～1.51%，采取经验系数法对基体效应进行校正。选一试样11 次压片测定，各成分结果的相对标准偏差＜1%，用该方法测定某一大型钼矿样品，其结果与其他单位湿法结果对比，具有良好的一致性，主量及伴生元素结果与标样认定值比对结果理想。

关键词: 粉末压片, 波长X 射线荧光光谱, 钼矿石, 伴生元素

Abstract:

The powder samples were pressed into slice by using high density polyethylene powder to trim lining, determination content of Mo and commonly associated elements W,Sn,Cu,Pb,Zn,Bi content by wavelength dispersive X-rafluorescence spectrometry.According to the characteristics of molybdenum ore grade,using national standard samples with a large molybdenum mine established by combining samples of the calibration curve,measuring range from 0.03% to 1.51%,The matrix effect was eliminated by using empirical coefficient method.The determination results of the method had good agreement with those of wet method.The relative standard deviation of each component were in the range of 0.073%~7.35% in 11 times of determination for same sample.The results of Mo,W, Sn,Cu,Pb,Zn,Bi obtained by the method were in good accordance with certified values.

Key words: Powder press slice, X-ray spectormetry, Molybdenum ores, Component associated elements

中图分类号:

O657.34

罗学辉，王春生，陈占生，张勇. 粉末压片—波长色散X 射线荧光光谱法在钼矿石测定中的应用[J]. J4, 2011, 19(2): 78-80.

LUO Xuehui,WANG Chunsheng,CHEN Zhansheng,ZHANG Yong. Determination of Molybdenum Ores by Powder Press Slice-Wavelength Dispersive X-Rafluorescence Spectrometry[J]. J4, 2011, 19(2): 78-80.

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